ALD2023 Wednesday Morning
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details.
Click a Session in the first column to view session papers.
Session | Wednesday, July 26, 2023 | |||||||||||||||
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8:00 AM | 9:00 AM | 10:00 AM | 11:00 AM | |||||||||||||
AA1-WeM |
3D Integrated Device Applications of ALD-Grown Ferroelectric and Oxide-Semiconductor Materials
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Cross-Point Metal-Ferroelectric-Metal Capacitors Array for Compute-in-Memory Applications
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Using ALD to Precisely Place Multiple Transition Metal Impurities to Defect Engineer MIM Diode Performance
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The Impact of Oxygen Source on the Formation of TiN Interface at the Initial Stage ALD process of Hafnia-based Ferroelectrics: An in-situ Analysis
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Performance Enhancement in HZO Based Ferroelectric Memory Devices
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Stabilization of Tetragonal Phase of Ti-doped ZrO2 Deposited by ALD
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Three Terminal Synaptic Devices Employing ALD Grown Dual Dielectrics and Their Linear Learning Process
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Break & Exhibits
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AA2-WeM |
Opportunity of Atomic Scaled Materials in Revolutionary Memory Technologies
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Ultra High-k HfZrO4 Thin Films Grown by Atomic Layer Deposition using Metal-Organic and Brute HOOH Precursors
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Achieving Ultra-High Mobility and Reliability of ALD-IGZO TFTs via Selective N2O Plasma Reactant for BEOL Applications
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Ultrathin and Highly Crystalline Indium Oxide Thin Films Using Novel Liquid In Precursor as a New Channel Material
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AF1-WeM |
Measuring the Time-Resolved Heat of ALD Surface Reactions
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HfO2 ALD on Si(111) - A Mechanistic in-Situ Study through Time-resolved APXPS
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In Situ Reflection High Energy Electron Diffraction Investigations of Epitaxial Growth and Crystallization of Gallium Oxide Thin Films
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Surface and Film Stress during ALD of Al2O3 and ZnO: In Situ Measurements Using Wafer Curvature Techniques
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Chemisorption Mechanisms of Aminosilane Precursors during ALD of SiO2: in situ Characterization and ab initio Study
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Seeing It Happen: Insights Into the Surface Chemistry of HfO2 and TiO2 ALD from Operando Ambient Pressure X-ray Photoelectron Spectroscopy
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Break & Exhibits
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AF2-WeM |
Preparation and Characterization of Well-Defined Mixed-Oxide and Metal-Oxide Interfaces in Porous Catalysts using ALD
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A Toolbox for Characterization of Film Penetration Depth in High Aspect Ratio Structures
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Understanding Process Parameters of ALD on Silica Aerogels and Their Effects on Mechanical Properties
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Tuning Properties of ZnO Deposited via ALD for Applications in Sensing and Porous Material Development
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ALE1-WeM |
Plasma-Enhanced Atomic Layer Etching for Metals and Dielectric Materials
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Controlling the Hole Profile of High Aspect Ratio Structures in Atomic Layer Etching of SiO2 by Utilizing Dc-Superposition in Capacitively Coupled Plasmas
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Damage Analysis of Reactive Ion and Quasi-Atomic Layer Etched Silicon
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Atomic Layer Etching of SiO2 via H2/SF6 Plasma and TMA
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Learnings and Mitigations of Nonuniformity in Oxide Quasi Ale Applied to Contact Patterning
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Adopting a Low Global Warming Potential Fluorocarbon Precursor (C6F6) to Atomic Layer Etching of Sio2 with Fluorocarbon Plasmas
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Thermal ALE Reactants for Semiconductor Processing
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Break & Exhibits
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ALE2-WeM |
Isotropic Plasma-Thermal Atomic Layer Etching of Aluminum Nitride Using SF6 Plasma and Al(CH3)3
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Gan Atomic Layer Etching Using SF6 and Ar Plasmas Controlled by RFEA and Langmuir Probe Measurements
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Speedy and Smooth Atomic Layer Etching for Silicon Carbide with DC Bias-Pulsing
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Thermal Atomic Layer Etching of MoS2 Films
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AM-WeM |
Atomic Layer Technologies for III-V Nitride Epitaxy, High-K/Metal Gate, Ferroelectric Negative Capacitance, and Area-Selective Deposition
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Optimizing Vessel Design for Pulsed Delivery of Solid Precursors
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Accurate Precursor Dose Delivery with Realtime Closed Loop Control
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Fast and Efficient Large Format ALD
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Mechatronic Spatial Atomic Layer Deposition for Closed-Loop Process Control
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Spatial Atomic Layer Deposition: A New Revolution in Ultra-Fast Production of Conformal Optical Coatings
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Spatial ALD of Iridium Oxide Electro-Catalyst Layers for PEM Electrolysis
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Break & Exhibits
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EM-WeM |
Novel Organic-Inorganic Hybrid Thin Films Deposited by Molecular Atomic Layer Deposition (MALD) for EUV Resist Applications
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Inorganic Cluster Synthesis and Characterization via Atomically Precise ALD in Polymers
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Molecular Layer Deposition of Al- and Hf-Based Hybrid Resists for Electron-Beam and EUV Lithography
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High-resolution EUV Lithographic Patterning Characteristics of InOx-PMMA Hybrid Photoresist Generated by Vapor-phase Infiltration
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