ICMCTF2002 Coating and Thin Film Characterization Sessions

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Session Code Start Session Name
F4-1- Monday, April 22, 2002 10:30 AM Microstructural, Microanalytical and Imaging Characterization
F4-2- Monday, April 22, 2002 1:30 PM Microstructural, Microanalytical and Imaging Characterization
F1/E4-1- Tuesday, April 23, 2002 8:30 AM Mechanical Properties and Adhesion
F1/E4-2- Tuesday, April 23, 2002 1:30 PM Mechanical Properties and Adhesion
FP-1- Tuesday, April 23, 2002 5:00 PM Symposium F Poster Session
F3-1- Wednesday, April 24, 2002 8:30 AM Surface and Thin Film Analysis
F3-2- Wednesday, April 24, 2002 1:30 PM Surface and Thin Film Analysis
F5-1- Thursday, April 25, 2002 8:30 AM Characterization of Thin Film Growth Mechanism and Evolving Film Properties
F5-2- Thursday, April 25, 2002 1:30 PM Characterization of Thin Film Growth Mechanism and Evolving Film Properties
F2-1- Friday, April 26, 2002 8:30 AM Nondestructive and In-Situ Characterization
Topics | Time Periods | Schedule Overview