ICMCTF2000 Coating and Thin Film Characterization Sessions

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Topics | Time Periods | Schedule Overview

Session Code Start Session Name
F3- Monday, April 10, 2000 10:30 AM Surface and Thin Film Analysis
F3-2- Monday, April 10, 2000 1:30 PM Surface and Thin Film Analysis
F1/E4- Tuesday, April 11, 2000 8:30 AM Mechanical Properties and Adhesion
F1/E4-2- Tuesday, April 11, 2000 1:30 PM Mechanical Properties and Adhesion
F1/E4-3- Wednesday, April 12, 2000 8:30 AM Mechanical Properties and Adhesion
F4- Wednesday, April 12, 2000 1:30 PM Microstructural, Microanalytical and Imaging Characterizaiton
FP- Wednesday, April 12, 2000 5:00 PM F Poster
F5- Thursday, April 13, 2000 8:30 AM Characterization of Thin Film Growth Processes and Evolving Film Properties
F5-2- Thursday, April 13, 2000 1:30 PM Characterization of Thin Film Growth Processes and Evolving Film Properties
F2- Friday, April 14, 2000 8:30 AM Nondestructive and In-Situ Characterization
Topics | Time Periods | Schedule Overview