AVS2008 WeM Sessions , Wednesday, October 22, 2008 8:00 AM
Wednesday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
Session Code | Topic | Session Name |
---|---|---|
AS-WeM | AS | Advanced Data Analysis for Surface Characterization |
BI+NC-WeM | BI | Quantitative Nanoscale Sensing and Single Molecule Techniques |
BO+AS+BI+NC-WeM | BO | Organized and Structured Organic Interfaces |
EM-WeM | EM | High-K Oxides and High Mobility Substrates |
EN+AS+EM+TF-WeM | EN | Electrochemical Storage |
IS+SY+SS-WeM | IS | In Situ Spectroscopy – Interfacial Science and Catalysis |
MI+NC-WeM | MI | Magnetic Thin Films, Nanoparticles and Nanostructures |
NM+MS+NS+NC-WeM | NM | Beyond CMOS |
NS+NC-WeM | NS | Characterization and Imaging of Nanostructures |
PS1-WeM | PS | Plasma-Surface Interactions in Materials Processing I |
PS2-WeM | PS | Plasma Sources |
SE-WeM | SE | Atmospheric Pressure Treatments and Hard and Nanocomposite Coatings |
SS1+NC-WeM | SS | Surface Structure and Morphology |
SS2+NC-WeM | SS | Functional Metal Oxides and Quantum Metal Structures |
TF-WeM | TF | Chemical Vapor Deposition |
TR+MN+NC-WeM | TR | Surfaces and Interfaces in MEMS/NEMS |