SIMS2015 Thursday Morning
Sessions | Time Periods | Topics | Schedule Overview
        Hover over a paper or session to view details.
        Click a Session in the first column to view session papers.
    
    
| Session | Thursday, September 17, 2015 | ||||||||||
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| 8:40 AM | 9:40 AM | 10:40 AM | 11:40 AM | ||||||||
| DG1-ThM | 
                                 
                                    Method for Quantification of Insecticide in Mosquito Netting using Ion Implantation and TOF-SIMS Analysis
                                    
                                 
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                                    Depth Profiling the Oxidation State of UO2 Samples
                                    
                                 
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                                    Light Elements Measurements using the CAMECA IMS 7f-Auto
                                    
                                 
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                                    High Quality Profiles for Inorganic Material using Arn+ Clusters: A Must for Hybrid System Profiling and How to Achieve Them.
                                    
                                 
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                                    Recent Developments in ToF-SIMS Depth Profiling of Inorganic and Organic Thin Films
                                    
                                 
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                                    Low Energy Cesium Depth Profiling of Hybrid Materials
                                    
                                 
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                                    Surface Analysis and Depth Profiling of Polymer Multilayers by ToF-SIMS and XPS: A Possible Model for Complex Matrices Analysis
                                    
                                 
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                                    Reconstructing Accurate ToF-SIMS Depth Profiles for Organic Materials with Differential Sputter Rates
                                    
                                 
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| DP1-ThM | 
                                 
                                    Ion Formation and the Interpretation of Static SIMS Spectra
                                    
                                 
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                                    The Matrix Effect in SIMS Organic Depth Profiling: A VAMAS Inter-laboratory Comparison
                                    
                                 
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                                    Statistically Rigorous Analysis of Imaging SIMS Data in the Presence of Detector Saturation
                                    
                                 
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                                    Random Projection Based Methods for Rapid Segmentation and Compression of Large SIMS Images
                                    
                                 
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                                    Simultaneous Analysis of Multiple 3D Datasets via Application of MVSA Techniques
                                    
                                 
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                                    Multivariate Analysis of Very Large 2D and 3D ToFSIMS Datasets by a Rapid PCA Method, with Optional Low Discrepancy Subsampling
                                    
                                 
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                                    Variable Scaling in Chemometrics: Reducing Loading Bias Resulting from Widely Varying Ion Yields
                                    
                                 
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                                    ToF-SIMS as a Screening Technique - A Multivariate Data Analysis Approach
                                    
                                 
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                                    Methodology for Analyzing Ultra-Small Nanoparticles
                                    
                                 
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| SR1-ThM | 
                                 
                                    Composition Analysis of III-V Materials Grown in Nanostructures for Semiconductor Applications: the Self Focusing SIMS Approach
                                    
                                 
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                                    Recent Advances in Ultra High Spatial Resolution SIMS with Oxygen Focused Ion Beams
                                    
                                 
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                                    Sub 20 nm SIMS Imaging on the ORION NanoFab
                                    
                                 
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                                    High-Resolution Imaging of the Distributions of Cholesterol and Sphingolipids in Cellular Membranes
                                    
                                 
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