SIMS2015 Thursday Afternoon

Sessions | Time Periods | Topics | Schedule Overview

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Session Thursday, September 17, 2015
2:00 PM 3:00 PM 4:00 PM 5:00 PM
DO1-ThA
ToF-SIMS of Frozen Hydrated Hydrogels
Comparison of Cs+, C60+ and Arn+ for ToF-SIMS Sputtering of PS-b-PMMA
Direct Comparison of Argon Gas Cluster Ion Beams and C60 in Molecular Depth Profiling of Organic Thin Films
Argon Cluster Sputtering – Effects of Angle of Incidence, Sample Temperature and Composition
The Comparison of Matrix Effects Depending on the Combination of Polymers in a Sample for Depth Profiles Using Ar Cluster Ion Beams
Molecular Depth Profiling with Strong Field Post-Ionization
Additive Chemistry and Distributions in Photoresist Thin Films
Depth Profiling and Composition Analysis of Polymer:Fullerene Blend Layers for Organic Photovoltaics
Interdiffusion of Fullerene Derivative into Conjugated Polymer Matrix upon Solvent Vapor Annealing
Structural Analysis of the Outermost Hair Surface using TOF-SIMS with GCIB Sputtering
IS1-ThA
Understanding Hydration of Proteins by SALVI and Liquid ToF-SIMS
Investigating Shewanella oneidensis Biofilm Matrix in a Microchannel by In Situ Liquid ToF-SIMS
In Situ Chemical Imaging of Environmental Liquid Surfaces and Interfaces Using Microfluidics and Dynamic ToF-SIMS
Glyoxal Aqueous Surface Chemistry by SALVI and Liquid ToF-SIMS
In-Situ Molecular Monitoring at the Electrode-Electrolyte Interface Using ToF-SIMS
Improving Molecular Ion Signal Intensity for Application of In Situ Liquid SIMS on Biology and Environmental Research
In-situ Liquid SIMS Probing of the Solid-Electrolyte Interphase (SEI) in Lithium Ion Batteries
Mn Dissolution and its Impacts on the Spinel Based Li-ion Batteries Degradation: a FIB TOF SIMS Study
NN1+
The Role of SIMS in Developing Innovative Nanocharacterization Approaches
Nanoparticle Analysis in Biological Systems
Characterization of Individual Free-standing Nano-objects by Cluster-SIMS in Transmission
Characterization of Nanometric Inclusions via Nanoprojectile Impacts
Revisiting Ion Sputtering of Inorganic Thin Films
Temperature Dependent Cs+ Ion Yield Changes During Cesium Bombardment SIMS
Angular Distribution of Molecules Sputtered by Gas Cluster Ion Beams and Implications for Secondary Neutral Mass Spectrometry
High-mass Heterogeneous Cluster Formation by Ion Bombardment of Binary and Ternary Al/Cu/Au Alloys.
Molecular Depth Profiles Simulation: A Transport & Reaction Approach
Sessions | Time Periods | Topics | Schedule Overview