SIMS2015 Monday Afternoon
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details.
Click a Session in the first column to view session papers.
| Session | Monday, September 14, 2015 | ||||||||||
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| 2:00 PM | 3:00 PM | 4:00 PM | 5:00 PM | ||||||||
| 3D1+ |
3D Imaging ToF-SIMS for Biology – Are We Living the Dream?
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3D Organic Structure Characterization by FIB-TOF Tomography
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3D-SIMS Characterization of Dictyostelium Discoideum during Chemotaxis
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A Picture Is Worth a Thousand Words: Optimization For ToF-SIMS Tissue Images
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Mass Spectrometry Image Fusion: What Works and What Doesn’t
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The Benefits and Pitfalls of Image Fusion
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Combining XPS Atomic Concentration Data with a ToF-SIMS Chemical Image Map using Image and Data Fusion
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Exploring New Sources of High Resolution Data for Image Fusion
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| CI1-MoA |
Depth Profiling of Inorganic Thin Films Using Large Oxygen Gas Clusters
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Sputtering with Large On+ Cluster Projectiles on Inorganic Surfaces
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Current Prospects of Organic Analysis with Ar-GCIB SIMS, from Synthetic Polymers and Organic Devices toward Biological Materials
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Molecular Cluster Emission in Sputtering of Amino Acids by Argon Gas-cluster Ions
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Argon Cluster Total Sputter Yield: Quartz Crystal Microbalance Measurements and Semi-Empirical Predictive Model
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Quantitative Studies of Matrix Effects in Massive Cluster Impact (MCI) Sputtering of Intact Lipid and Peptide Ions
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Enhanced Ionisation Using Water-containing Cluster Ion Beams - A Fundamental Study
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Comparative Study of Secondary Ion Emission from Organic Thin Film Bombarded with Water, Methanol and Methane Cluster Ions
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Investigation of Surface-adsorbate Interaction of Surface-adsorbed (bio-) Molecules Using Desorption/Ionization Induced by Neutral Clusters
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Applications Of Tof-Sims For Imaging And Depth Profiling Commercial Materials
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| FS1+ |
FIB ToF-SIMS Tomography of through Silicon vias for 3-D Integration
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Demonstration of Crater Wall Imaging as a Useful Tool in Functional Materials Research
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Comparison of Conventional Dual Beam SIMS Depth Profiling with FIB/SIMS Cross Section Analysis
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Lithiation Mechanisms of Composite Silicon Electrodes Revealed by FIB-TOF-SIMS: A Novel Way for the Study of Local Chemistry and Structure Dynamics in Electrode Materials
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Oxide Development of Thermally Grown Oxides in SOFC Interconnect Materials Studied by ToF-SIMS using Isotope and FIB Crater Wall Analysis
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MD Simulations of Polymer Sputtering by Large Gas Clusters: Effects of Cluster Nature (Ar, CH4), incidence angle and sample molecular weight
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Development of Ambient SIMS using MeV-energy ion probe
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MeV Particles, Huge Impact, Soft Desorption
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MeV SIMS – A New Method for the Characterization of Modern Paint Materials
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