SIMS2015 Session CT-TuP: Complementary Techniques and Multi-Technique Approaches Poster Session
Time Period TuP Sessions | Topic CT Sessions | Time Periods | Topics | SIMS2015 Schedule
CT-TuP-1 Multitechnique Characterization of Protein G B1 Orientation on Surfaces
Elisa Harrison, Gianluca Interlandi, David Castner (University of Washington) The orientation of adsorbed proteins on surfaces has been shown to influence biological responses. Therefore, research and development of biotechnological applications such as sandwich ELISAs have focused on controlling the orientation of each protein layer. Characterizing protein orientation has been a challenge. Our goal is to address these challenges by developing methodology to study multilayer protein systems. In this work, we aim to determine the orientation of protein G B1, an IgG antibody-binding domain of protein G, on various surfaces and the effect of orientation on antibody binding using a variety of surface-sensitive tools and simulations. We propose that binding selectivity will increase for well-ordered protein films due to high availability of binding domains. We used surface modification to control protein orientation, specifically utilizing four types of self-assembled monolayers (SAMs): N-Hydroxysuccinimide-terminated SAMs and dodecanethiol SAMs to immobilize protein G B1 in a random orientation and maleimide-terminated SAMs and bare gold to immobilize cysteine mutants of protein G B1 in a well-ordered orientation. The surface sensitivity of ToF-SIMS enables us to detect different proteins and their orientation based on the amino acid concentrations. Previous ToF-SIMS methods have been developed for the analysis of single protein films. We intend to further develop this technique for the application of studying multilayer systems. We also use complementary techniques, such as XPS and quartz crystal microbalance with dissipation monitoring (QCM-D), to provide detailed information about the composition, coverage, and orientation of the adsorbed proteins. Additionally, computational methods to predict the orientation of proteins on surfaces can complement and help interpret experimental techniques. In this work, we describe the development of a simulator to determine protein orientation on a surface using Monte Carlo (MC) simulations. To test the MC simulator, we used the simple peptide LKa14 because of its predictable structure and orientation on hydrophobic surfaces. Preliminary MC simulations have also predicted possible interactions between amino acid residues of protein G B1 and a graphene surface. We will extend the MC algorithm to predict the orientation of additional protein/surface combinations and validate using experimental results. While the model systems explored in this study are less complex compared to biological systems of the real world, this is a first step in developing methodology using state-of-the-art tools that can be continuously improved to expand our knowledge and control of biomolecules on surfaces. |
CT-TuP-2 SIMS and GD-MS depth profile analysis of Cu(In,Ga)Se2 photovoltaic cell structures
Piotr Konarski (Institute of Tele and Radio Technology, Poland); Maciej Miśnik (Institute of Tele and Radio Technology, Warszawa, Poland); Tomasz Drobiazg, Paweł Zabierowski (Faculty of Physics, Warsaw University of Technology, Poland); Nicolas Barreau (Institut des Matériaux Jean Rouxel, Université de Nantes, CNRS, France) We have prepared a set of layered structures of Cu(In,Ga)Se2, molybdenum and soda lime-glass which are a part of thin film solar cell structure. In the complete photovoltaic structure a layer of Cu(In,Ga)Se2 is absorbing photons, molybdenum serves as a back contact and soda-lime glass is the substrate. Our absorbers were prepared in co-evaporation process from the elemental sources of copper, indium, gallium and selenium and they are 1.45 to 1.8 micrometer thick, the thickness of molybdenum layer is 650 nm. For this type of semiconducting material band gap value depends on the concentration of indium and gallium in the layer and can be easily controlled by the modification of fluxes of these elements during the co-evaporation process. Therefore, three of our samples have a flat distributions of indium and gallium which results in the same band gap across the layer. Only the total amount of indium and gallium is different, which gives different values of band gap between these samples. Remaining samples have graded indium and gallium profiles in order to improve carrier collection by built-in electric field resulting from the graded band gap. Graded profiles were obtained by the modification of indium and gallium flux during the co-evaporation of these elements. To modify fluxes we simply change temperature of crucibles filled with the materials to evaporate. Two depth profile analytical techniques: secondary ion mass spectrometry (SIMS) and glow discharge mass spectrometry (GD-MS) were applied for analysis of the above mentioned structures. Aim of the study was to find optimal quantitative analytical procedures allowing us to monitor atomic concentrations of Ga and In and their gradient across the structure. Front side as well as backs side depth profiles were done. GD-MS analysis was performed in ~0.1 Torr Ar, 1.5 kV DC glow discharge and SMWJ-01 [1] spectrometer was used. 1.5mm diameter spots were analyzed. SIMS analysis was performed on SAJW-05 [2] apparatus equipped with Physical Electronics 06-350E ion gun and QMA-410 Balzers quadrupole analyzer. Sputtering with 5 keV Ar+, 100 µm diameter ion beam was performed over 1.6mm x 1.6mm raster area, with 10% electronic gate. Discussion of the results concerns different analytical parameters of the two techniques. Acknowledgements: Authors (M.M. and P.K.) thank Ministry of Science and Higher Education, Poland, for project no DI2013 013943 founded in years 2014-2018. References [1] P. Konarski, K. Kaczorek, M. Ćwil, J. Marks; Vacuum 81, 1323-1327 (2007). [2] P. Konarski, A. Mierzejewska; Appl. Surf. Sci.203–204, 354–358 (2003). |
CT-TuP-3 Synthesis of Hydrophobic Functional Group on the Silica Surface with Surface Analyzing Method
Sun Mi Jin, Do Yeon Kim (Korea Basic Science Institute); Tae Eun Hong, Jong Sung Jin (Korea Basic Science Institute, Republic of Korea) Recently, we synthesized silica derivatizers by sol-gel condensation of TEOS with self assembled organogels that prepared by mixed 1,2-diphenylethylenediamine based neutral (G1) and cationic (G1N) gelators in ethanol solvent and calcination method after organic-inorganic copling reaction based on the micro silica gel with organic polymeric compounds. The various properties such as morphological structure, elemental content, molecular structure and etc. of derivatized compounds were analyzed by SEM, EA, XPS and so on. And we analyzed products of each steps for derivatized the silica derivatives by TOF-SIMS in order to sanction the reactions. |
CT-TuP-5 Multi Technique Analysis of Chalk after Fluid Injection of MgCl2
Jean-Nicolas Audinot (Luxembourg Institute of Science and Technology (LIST), Luxembourg); Patrick Grysan, Esther Lentzen (Luxembourg Institute of Science and Technology (LIST)); Tania Hildebrand-Habel, Silvana Bertolino, Aksel Hiorth, Reidar Kornes, Merete Madland, Udo Zimmermann (University of Stavanger) The use of fluid injection for improved or enhanced oil recovery (EOR) is an often studied subject and results have been used in the production of hydrocarbons. New is the possibility of provoking mineral growth on a geological very short term during those injections with more possibilities for EOR and other related applications [1]. The first long-term test on chalk with the injection of MgCl2 under reservoir conditions was realized. Outcrop chalk of Late Campanian age (Gupen Formation) from Liège (Belgium) was flooded for 516 days for improved/enhanced oil recovery purposes. We discover massive precipitation of secondary minerals, which changes the rock properties of the chalk fundamentally. These changes are taking place in non-geological times and on nano-scales, and are paramount for any EOR approaches, hence of highest importance for the hydrocarbon interested peer groups. After flooding with MgCl2 brine, the Liège chalk was sliced into 6 equal parts perpendicular to its long axis. It appears severely altered by the experience, changed in texture, exemplified by the absence of coccolith fragments and a more rough grain appearance, although angular, well-formed rhombic grains frequently occur. The first centimeters of the flooded chalk sample show an increase in MgO and a depletion of CaO by more than 70 %. These dramatic mineralogical and geochemical changes were observed with SEM-EDS [2]. However, the large spot-size of the SEM-EDS application (1-2 micron) did not allow in pinpointing the chemistry of the new growing mineral beyond doubt and the element distribution on a sub-micron scale. Therefore, we probed the phases in question by NanoSIMS. The elements detected and mapped by NanoSIMS were the major and trace elements such as the carbone, chlorine and silicon. The analysis demonstrated the absence of CaO in the new grown mineral whereas chlorine and silica disseminated as nano-phase in the chalk matrix . The NanoSIMS results allowed to understand the distribution and mineralogical reactions and to gain reasoning for the precipitation of magnesite and to evaluate the dissemination of silica, Cl and other elements before and after flooding on a nano-scale for quantification purposes [2]. The formation of new secondary minerals seems to trigger an enhanced dissolution of the chalk matrix, which induced porosity changes. However, it is importance to test now compaction and other petrophysical proxies to model such long-term fluid injections on a larger scale. [1] Hermansen, H. et al. J. of Petroleum Science and Engineering, v. 26, p. 11-18 (2000). [2] Zimmermann et al. AAPG Bulletin, V. 99, No. 5, PP. 791 – 805 (2015) |
CT-TuP-6 Hyperspectral Optical Imaging Combined with ToFSIMS and Principal Component Analysis for Analysis of Biological Structures and Pigments
Peter J. Cumpson, Naoko Sano, Jose Portoles (National EPSRC XPS Users’ Service (NEXUS), UK) ToFSIMS is an excellent technique for “label free” analysis of biological surfaces. In validating results when applied to new biomedical problems inevitably these results must be compared with conventional techniques such as staining and fluorescent labelling of structures. This is often more of a problem than it should be: biomedical collaborators have exactly the right tools to image staining or fluorescence using appropriate light microscopes, but there is always an issue of digital file format conversion and image registration that makes it difficult or uncertain to overlay this on the ToFSIMS image. This makes collaboration more time-consuming than it should be. Therefore instead we have implemented a hyperspectral imaging microscope in the entry chamber of our ToFSIMS system, so as to provide the best possible optical images of the region of interest. The near-infrared region makes the instrument very powerful in the study of heterogeneous biological samples. Near-infrared (NIR) light penetrates many biological structures and materials, particularly lipids, and gives rise to diffuse scattering within. What is absorbed in the material is not reflected, so absorbance images can have significant contrast. We have developed two Hyperspectral Imaging (HSI) systems, one for sample plattern imaging (centimetres in size) and a microscope version for feature imaging (millimetre regions of interest) based on a wide wavelength camera. An integrating sphere is used to ensure diffuse illumination and the absence of shadowing. |
CT-TuP-7 Complementary Imaging of Li and B in Nuclear Waste Glass using ToF-SIMS, NanoSIMS, and APT
Jia Liu, Yufan Zhou (Pacific Northwest National Laboratory); Zhaoying Wang (Institute of Chemistry, Chinese Academic of Science); Daniel Schreiber, Jarrod Crum, James Neeway, Joseph Ryan, Zihua Zhu (Pacific Northwest National Laboratory) The determination of distribution of Li and B is of great interest in nuclear waste glass research [1-2]. During glass ceramic manufacture ions with different solubility are redistributed and form nano-sized droplets/crystals in multiple phases. The element distribution, especially alkali and boron, is very important to design the components of the glasses, optimize heating/cooling procedures, and parameterize many important corrosion mechanisms. It is challenging to use common analytical imaging tools, such as SEM and TEM, to image Li and B distribution in glass samples with nanoscale resolution. In this study, time-of-flight secondary ion mass spectrometry (ToF-SIMS), and nanoscale secondary ion mass spectrometry (NanoSIMS) and atom probe tomography (APT) were used to map the distribution of Li and B in a few representative glass samples. APT provides 3-dimensional imaging with spatial resolution (≤2 nm) for Li and B in glasses. ToF-SIMS and NanoSIMS provide ≤100 nm lateral resolutions for 2-dimensional imaging of Li and B in glass samples. Comparing these two techniques, 2-dimensional SIMS imaging is more sample-friendly, low time-cost, with flexible field-of-view (from 1 × 1 µm2 to 500 × 500 µm2, and image-stitching is feasible). Therefore, SIMS and APT are considered as complementary techniques for nanoscale imaging of Li and B in glass samples. [1] S. Gin, J. V. Ryan, D. K. Schreiber, et al., 349–350, 99 (2013) [2] J. Crum, V. Maio, J. McCloy, et al., 444, 481 (2014) [3] This work was supported by the Department of Energy, Office of Nuclear Energy. This research was performed using EMSL, a national scientific user facility sponsored by the Department of Energy's Office of Biological and Environmental Research located at Pacific Northwest National Laboratory. |
CT-TuP-9 A Comparison of SIMS and RBS for the Depth Profiling of Silica Glasses Implanted by Metal Ions
Jan Lorincik (Institute of Photonics and Electronics of the AS CR v.v.i., Research Center Rez, Czech Republic); Sona Vytykacova, Blanka Svecova, Pavle Nekvindova (University of Chemistry and Technology, Czech Republic); Anna Mackova, Romana Miksova (Nuclear Physics Institute, Academy of Sciences of the Czech Republic, Department of Physics, Faculty of Science, J.E. Purkinje University, Usti nad Labem, Czech Republic); Roman Boettger (Institute of Ion Beam Physics and Materials Research, Helmholtz Zentrum, Germany) Ion implantation of metal ions followed by annealing can be used for the formation of buried layers of metal nanoparticles in glasses with optical properties for perspective photonic materials. Results are presented from three samples of silica glasses implanted with Cu+, Ag+ or Au+ ions under the same conditions (energy 330 keV and fluence 1×1016 ions/cm2) and three silica glass samples implanted with the same metals and conditions but co-implanted subsequently by oxygen into the same depth. All the implanted glasses were annealed at 600°C, which lead to forming of metal nanoparticles. The depth profiles measured by RBS and SIMS indicated that the sequential implantation of oxygen followed by post-annealing caused the shift of Cu, Ag and Au aggregated into nanoparticles deeper into the glass substrate. Both RBS and SIMS are shown to be valuable complementary techniques. Acknowledgement The research has been realized at the CANAM (Center of Accelerators and Nuclear Analytical Methods) infrastructure and has been supported by project GACR 15-01602S and by the SUSEN Project CZ.1.05/2.1.00/03.0108 (ERDF). |
CT-TuP-11 Application of Ar-GCIB Depth Profiling with XPS of Selected Cell Lines
Magdalena Wytrwał, Magdalena Woszczek, Mateusz M. Marzec (AGH University of Science and Technology, Poland); Szymon Prauzner-Bechcicki (The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences,, Poland); Małgorzata Lekka (The Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Poland); Andrzej Bernasik (AGH University of Science and Technology, Poland) X-ray photoelectron spectroscopy (XPS) analysis has been a ubiquitous method for characterization and investigation in the field of classical materials for a long time [1]. However its application to systems of biological nature is still rather limited. In the literature there are some reports on food products (proteins, lipids, carbohydrates) and microbial cells [2,3,4]. The Gram character of bacterial strains was not revealed by cluster analysis [4]. A relationship between the surface composition of bacteria (N/P or N/C ratio) and surface electrical properties (isoelectric point and electrophoretic mobility) was observed for various sets of microorganisms [4]. XPS provides a good balance between qualitative information, quantification and surface selectivity, to investigate the spatial distribution of components and to understand properties and processes. In the present study, we analyzed selected protein (fatal bovine albumin, BSA) and cell lines (normal and cancer; human and animal). For our experiments we choose human non-malignant (HCV29) and malignant cells (T24 and HT1376) of bladder cancer, human skin fibroblasts (HSF) and mouse embryonic fibroblasts (MEF). Cells were fixed and examined using optical and atomic force microscopy observation. Special attention was focused on XPS analyses. The chemical states of cells’ elements were examined by XPS spectra measurements (Scanning XPS Microprobe PHI 5000 Versa Probe II, ULVAC-PHI). Depth distribution of the elements and their chemical states were examined by sputtering with argon gas cluster ion beam (Ar-GCIB) with Zalar rotation. As a reference, the culture media and fatal bovine serum (FBS) atomic composition were analyzed. This very recent and unique technique allows to preserves chemical structure of organic materials under sputtering. [1] P. G. Rouxhet, M. J. Genet, Surf. Interface Anal. 2011, 43, 1453 [2] M. Jayasundera, B. Adhikari, P. Aldred, A. Ghandi, J. Food Eng. 2009, 93, 266 [3] E. H. J. Kim, X. D. Chen, D. Pearce, J. Food Eng. 2009, 94, 182 [4] M. J. Genet, C. C. Dupont-Gillain, P. G. Rouxhet, Medical applications of Colloids (Ed.: E. Matijevic), Springer Science + Business media, LLC, New York, 2008, 177 |
CT-TuP-12 The Depth Profiling of Hydrogen by Time of Flight Medium Energy Ion Scattering (TOF-MEIS)
Jwa Soon Kim, Kwang Hwan Jung, Kyung Soo Park, Sung Yup An, Won Ja Min, Kyu-Sang Yu (K-MAC, Republic of Korea) The depth profile of hydrogen is measured by Time of Flight-Medium Energy Ion Scattering/Direct Recoil spectrometry (TOF-MEIS/DR, K-MAC). MEIS analyzes the compositional depth profile of the sample by measuring the scattered ion energy. This technique has been widely used in various fields especially on the heavy element analysis. On the other hand, light element analysis such as hydrogen has been suffered from low scattering ion count and the peak overlap with substrate region in energy domain spectrum. To overcome this small scattering yield and the peak overlap, elastic recoil direct analysis (ERDA) was used. In this report, we tried to measure direct recoiled hydrogen particles by using 100 keV He+ ion and TOF analyzer. With TOF measurement, lighter recoiled hydrogen arrives faster at detector than the scattered helium ions of same energy. As a result, the recoiled hydrogen peak is separated from that of scattered helium at the time domain without using both mylar film or additional ion optics. Furthermore, TOF method analyzes the neutralized particles as well as the charged particles; the amount of the hydrogen is very quantitative. We analyzed the hydrogen profile of silicon nitride on glass, silicon oxide on silicon, and amorphous carbon on silicon substrate. |