PCSI2027 Monday Evening

Sessions | Time Periods | Topics | Schedule Overview

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Session Monday, January 18, 2027
7:30 PM
PCSI-MoE
UPGRADED: Time Evolution of Surface Chemical Reactions During Aluminum Oxide Atomic Layer Deposition on InAs
Direct Evaluation of SiO2/Al2O3 Interface Dipole for Si/SiO2/Al2O3/HfO2 Gate Stack Using Operando HAXPES
How to Choose a Gate Dielectric for Rutile GeO₂
Study of Metallization-Induced Interface Traps and Charge in Al2O3/SiO2/Si MOS Stack Using C–V/G–V Measurements and TCAD Simulations
Influence of Ti Adhesion Layer and ALD Al2O3 Thickness on Metal/Insulator/Metal (MIM) Interfacial Energy Barriers
Consistency Checks for Semiconductor Contact Extraction
Studying Thin Film Surface & Interface Engineering Using Xps and Strataphi: Depth-Resolved, Non-Destructive Analysis of Layered Materials
Sessions | Time Periods | Topics | Schedule Overview