AVS 71 Session EW-TuL: Exhibitor Technology Spotlight Session II

RHK Technology was founded in 1981 to develop new research tools for the Surface Science research community.The first product introduced was a High Resolution Electron Energy Loss Spectrometer (HREELS) followed by a Digital Temperature Controller for Temperature Programmed Desorption (TPD) measurements.RHK introduced its first Scanning Probe Microscope control system in 1988.In the following 37 years, RHK has developed a wide range of cutting-edge Scanning Probe Microscopes focused on UHV and cryogenic environments.The company is located in Troy Michigan and has delivered over 1500 SPM systems to over 40 countries around the world.

Adam Kollin, the founder and CEO of RHK Technology will discuss the latest advances from RHK including their new tenth generation SPM control system, the R10.Further advances in their cryo-free SPM system will be highlighted such as new Lumin-SLT that features a 70% light collection efficiency for Cathodoluminescence (CL) Photoluminescence (PL), STM Light Emission (STM-LE) as well as Raman spectroscopy studies.Upcoming capabilities will also be discussed.

As demand for surface analysis increases across materials systems, the automation of modern instrumentation provides broader access to more robust analyses, over larger sample sets, with advanced approaches.The Kratos Axis Supra+ multi-technique XPS system incorporates automated sample handling with automated analysis of XPS, UPS, depth profiling and others, including higher energy Ag-Lα generated, quantitative HAXPES, for increased depth analysis and clarification of chemical state.

The Axis Supra+ is uncompromised in its ability to analyze the wide range of new advanced materials, including operando surface analysis measurement of battery materials while biasing or flowing current and heating.The multi-contact stage in the Axis Supra⁺ spectrometer accommodates the specialized holders for the operando analysis, supplying 4 electrical contacts to be used for these analyses, while still accepting all the standard sample platens for high throughput analysis. An inert sample transfer version of these multi-contact holders has also been developed, which allows the sample to be loaded onto the platen and electrical connections made in a glove box, and then loaded into the spectrometer without exposure to atmosphere.Cryo-cooling of battery and other materials has been shown to minimize degradation and chemical bonding damage that can be caused by x-ray exposure at room temperature, and Kratos offers new sample holder options that allow cooling of sample to cryogenic temperatures to mitigate chemical changes during XPS measurement, as well as measure biological samples after fast freezing onto a pre-cooled sample holder.

The Axis Supra+ allows more samples to be analyzed with the full capabilities of the highest-performing XPS instrument, without intervention.Once samples are physically loaded, analyses are submitted through the computer interface, utilizing multiple cameras for location identification, which can be done remotely.This same principle follows for utilizing the HAXPES mono source, so that analysis by standard Al-Ka monochromatic x-rays can be automatically followed by analysis with the higher energy Ag-La monochromatic source and the results automatically processed and quantified using new Data Dependent Acquisition software features.Additional analytical techniques, such as Ag-Lα HAXPES, ISS, UPS, AES, REELS and IPES are all possible on the Supra⁺, and additional sample preparation chambers can be easily added, such as a station for deposition or the high-pressure, high-temperature gas reaction cell for catalysis experiments and measurement.