AVS 67 New Trends in Structural Electronic Characterization of Materials, Interfaces, and Surfaces Using Synchrotron and FEL Based Light Sources Focus Topic Sessions
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Topic Abstract Book
(309KB, Oct 26, 2021)
Topics
| Time Periods
| Schedule Overview
| Session Code | Session Name |
|---|---|
| LS-Contributed On Demand | New Trends in Structural Electronic Characterization of Materials, Interfaces, and Surfaces Using Synchrotron and FEL Based Radiation Sources Contributed On Demand Session |
| LS-Invited On Demand | New Trends in Structural Electronic Characterization of Materials, Interfaces, and Surfaces Using Synchrotron and FEL Based Radiation Sources Invited On Demand Session |