AVS 66 Spectroscopic Ellipsometry Focus Topic Sessions
Topic Abstract Book
(488KB, Apr 26, 2020)
Topics
| Time Periods
| Schedule Overview
Click a Session Code to view its Abstracts
Session Code | Start | Session Name |
---|---|---|
EL+AS+EM+TF-WeM | Wednesday, October 23, 2019 8:00 AM | Optical Characterization of Thin Films and Nanostructures |
EL+EM-WeA | Wednesday, October 23, 2019 2:20 PM | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |
EL-ThA | Thursday, October 24, 2019 5:00 PM | Spectroscopic Ellipsometry Late New Session |
EL-ThP | Thursday, October 24, 2019 6:30 PM | Spectroscopic Ellipsometry Focus Topic Poster Session |