AVS2017 Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic Sessions
Topic Abstract Book
(891KB, May 6, 2020)
Topics
| Time Periods
| Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Start | Session Name |
|---|---|---|
| SA+MI-TuM | Tuesday, October 31, 2017 8:20 AM | Overcoming the Temporal and Spatial Limits of X-Ray Scattering Methods for In-Situ Analysis |
| SA+AS+HC+SS-TuA | Tuesday, October 31, 2017 2:20 PM | Frontiers of Photoelectron Spectroscopy: Surface & Interface Processes with Variable Depth Probe, High Spatial or Temporal Resolution |
| SA-TuP | Tuesday, October 31, 2017 6:30 PM | Synchrotron and FEL-Based Analysis Poster Session |
| SA+2D+AC+MI-WeM | Wednesday, November 1, 2017 8:00 AM | Recent Advances of Diffracting/Scattering and Spectroscopic Methods for Correlated and 2D Materials |
| SA+AS+HC+SS-WeA | Wednesday, November 1, 2017 2:20 PM | In Situ and Operando Characterization of Interfacial Reactions in Energy & Electronic Devices |
| SA+AC+MI-ThM | Thursday, November 2, 2017 8:00 AM | Frontiers in Probing Properties and Dynamics of Nanostructures and Correlation Spectroscopy |