AVS2016 FrM Sessions , Friday, November 11, 2016 8:20 AM
Friday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| 2D+NS-FrM | 2D | 2D Materials: Device Physics and Applications |
| EL+AS+EM+MI+TF-FrM | EL | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |
| EM-FrM | EM | Late Breaking News on Electronic Materials and Devices |
| IS-FrM | IS | In situ Characterization of Nanomaterials |
| MN+MS-FrM | MN | Radiation Effect in Emerging Micro/Nano Structures, Devices, and Systems |
| SS+HC-FrM | SS | Deposition and Analysis of Complex Interfaces |
| TF-FrM | TF | CVD, ALD and Film Characterization |