AVS2010 Tuesday Afternoon

Sessions | Time Periods | Topics | Schedule Overview

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Session Tuesday, October 19, 2010
12:20 PM 1:20 PM
EW-TuL
A Multi-technique Approach to the Characterization of Patterned Polymers Using ESCALAB 250Xi
A New Cluster Ion Beam for Depth Profiling Challenging Organic Materials
Recent Developments in X-ray Photoelectron Spectroscopy Data Acquisition and Processing
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Sessions | Time Periods | Topics | Schedule Overview