AVS2000 WeA Sessions , Wednesday, October 4, 2000 2:00 PM
Wednesday Afternoon
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| BI-WeA | BI | Non-fouling Surfaces |
| DI+EL+MS-WeA | DI | Alternate Gate Dielectrics |
| MI+EL-WeA | MI | Magnetic Semiconductors and Hybrid Structures II |
| MM-WeA | MM | MEMS Processing |
| MS-WeA | MS | Process Integration (Cu/Low-k/300mm) |
| NS+NANO6-WeA | NS | Nanoscale Modification of Materials |
| OF-WeA | OF | Self-Assembled Monolayers: Electron Transfer and Film Properties |
| PS1+MS-WeA | PS | Sensors and Control in Plasma Processing |
| PS2-WeA | PS | Feature Evolution |
| SC+EL+SS-WeA | SC | Semiconductor Alloys |
| SS1+MC-WeA | SS | Oxide Surfaces, Interfaces and Defects |
| SS2+VT-WeA | SS | Adsorption and Desorption Phenomena I |
| SS3-WeA | SS | Surface and Interface Structure I |
| TF+EL-WeA | TF | In-situ Characterization of Thin Film Growth |
| VT-WeA | VT | Vacuum Gas Dynamics |