AVS1999 FrM Sessions , Friday, October 29, 1999 8:20 AM
Friday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
Session Code | Topic | Session Name |
---|---|---|
AS-FrM | AS | New or Improved Surface Related Analytical Techniques |
BI-FrM | BI | Interface, Properties, and Modification |
EM-FrM | EM | In Situ Monitoring and Growth |
MI-FrM | MI | Magnetic Thin Films |
MS+PS-FrM | NS | Diagnostics and Processes in Etching |
NT+NS+EM+MS-FrM | NT | Nanotubes: Growth, Characterization and Properties II |
PS-FrM | PS | Emerging Plasma Applications |
SS1+AS+BI-FrM | SS | Organic Films/Self-Assembled Monolayers |
SS2-FrM | SS | Adsorption on Metals and Silicon |
SS3+EM-FrM | SS | Reactions on Semiconductors |
TF-FrM | TF | In-situ Characterization and Material Process Imaging |
VT-FrM | VT | Vacuum Systems, Design, and Engineering |